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arXiv 1702.01716cond-mat.mes-hall
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拓扑绝缘体Bi2Te2Se薄膜的电子热导率和Lorenz数的大幅度增强

Large Enhancement of Electronic Thermal Conductivity and Lorenz Number in Topological Insulator Bi2Te2Se Thin Films

Zhe Luo, Jifa Tian, Mithun Srinivasan, Yong P. Chen, Xianfan Xu

摘要:

拓扑绝缘体(TI)由于其体相绝缘而表面导电的特性,引起了人们的广泛关注。然而,对拓扑绝缘体中的热输运,特别是表面态的影响的研究和理解还很缺乏。本文研究了Bi_2Te_2Se_TI薄膜的面内热导率随厚度的变化规律。对于厚度低于20 nm的膜,观察到热导率和电导率的大的增强,这归因于这些膜的表面状态和体绝缘性质。令人惊讶的是,表面的洛伦兹数超过10倍的索末菲值被发现。输运测量表明,当膜厚小于20 nm时,表面是接近电荷中性点。大Lorenz数的可能原因包括表面态Dirac流体中电流和热流的解耦以及涉及表面态的双极扩散输运。

英文摘要:

Topological insulators (TI) have attracted extensive research effort due to their insulating bulk states but conducting surface states. However, investigation and understanding of thermal transport in topological insulators, particularly the effect of surface states are lacking. In this work, we studied thickness-dependent in-plane thermal conductivity of Bi2Te2Se TI thin films. A large enhancement of both thermal and electrical conductivity was observed for films with thicknesses below 20 nm, which is attributed to the surface states and bulk-insulating nature of these films. Surprisingly, a surface Lorenz number of over 10 times the Sommerfeld value was found. Transport measurements indicated that the surface is near the charge neutrality point when the film thickness is below 20 nm. Possible reasons for the large Lorenz number include the electrical and thermal current decoupling in the surface state Dirac fluid and the bipolar diffusion transport involving surface states.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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