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arXiv 1502.07844cond-mat.mtrl-scicond-mat.mes-hall
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光电流谱研究拓扑绝缘体(Bi $_{0.5}$ Sb $_{0.5}$)$_2$ Te $_3$薄膜中的化学势涨落

Chemical Potential Fluctuations in Topological Insulator (Bi$_{0.5}$Sb$_{0.5}$)$_2$Te$_3$ Films Visualized by Photocurrent Spectroscopy

Christoph Kastl, Paul Seifert, Xiaoyue He, Kehui Wu, Yongqing Li, Alexander Holleitner

摘要:

研究了在SrTiO $_3$衬底上的拓扑绝缘体(Bi $_{0.5}$ Sb $_{0.5}$)$_2$ Te $_3$的光电流特性.我们发现可再现的,亚微米的光电流模式产生的长程化学势波动,主要发生在拓扑绝缘体/基板界面。我们制造纳米犁收缩,其中包括单一的潜在波动。据此,我们可以将无序势的大小量化为meV范围。结果进一步表明,在这样的纳米级收缩的表面状态中产生的占主导地位的光热电电流。

英文摘要:

We investigate the photocurrent properties of the topological insulator (Bi$_{0.5}$Sb$_{0.5}$)$_2$Te$_3$ on SrTiO$_3$-substrates. We find reproducible, submicron photocurrent patterns generated by long-range chemical potential fluctuations, occurring predominantly at the topological insulator/substrate interface. We fabricate nano-plowed constrictions which comprise single potential fluctuations. Hereby, we can quantify the magnitude of the disorder potential to be in the meV range. The results further suggest a dominating photo-thermoelectric current generated in the surface states in such nanoscale constrictions.

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