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arXiv 1208.5901cond-mat.mes-hallcond-mat.mtrl-sci
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分子结中分子-电极界面能量学的跃迁电压谱研究

Molecule-Electrode Interface Energetics in Molecular Junction: a Transition Voltage Spectroscopy Study

Guillaume Ricœur, Stéphane Lenfant, David Guérin, Dominique Vuillaume

摘要:

我们评估的性能的过渡电压谱(TVS)的方法来确定参与电子输运通过分子结的分子轨道的能量。研究了大量由不同化学结构的烷基链构成的分子结。在分子结的情况下,清洁,未氧化的电极-分子界面,即烷基硫醇和烯烃直接接枝在Au和氢化Si,分别,我们测量的过渡电压在0.9 - 1.4 V的范围内。我们得出结论,TVS方法允许估计的LUMO态密度的尾部的开始,在能量位于1.0 - 1.2 eV以上的电极费米能量。对于氧化界面(例如,用Hg或eGaIn液滴测量的相同单层,或在轻微氧化的硅衬底上形成的单层),系统地测量较低的转变电压(0.1 - 0.6 V)。这些值被解释的存在下的氧化物相关的态密度的能量低于HOMO-LUMO的分子。因此,TVS方法是评估分子结中分子-电极界面质量的有用技术。

英文摘要:

We assess the performances of the transition voltage spectroscopy (TVS) method to determine the energies of the molecular orbitals involved in the electronic transport though molecular junctions. A large number of various molecular junctions made with alkyl chains but with different chemical structure of the electrode-molecule interfaces are studied. In the case of molecular junctions with clean, unoxidized electrode-molecule interfaces, i.e. alkylthiols and alkenes directly grafted on Au and hydrogenated Si, respectively, we measure transition voltages in the range 0.9 - 1.4 V. We conclude that the TVS method allows estimating the onset of the tail of the LUMO density of states, at energy located 1.0 - 1.2 eV above the electrode Fermi energy. For oxidized interfaces (e.g. the same monolayer measured with Hg or eGaIn drops, or monolayers formed on a slightly oxidized silicon substrate), lower transition voltages (0.1 - 0.6 V) are systematically measured. These values are explained by the presence of oxide-related density of states at energies lower than the HOMO-LUMO of the molecules. As such, the TVS method is a useful technique to assess the quality of the molecule-electrode interfaces in molecular junctions.

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