arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1208.0776cond-mat.mes-hall
收藏

石墨烯中的碰撞电离和载流子倍增

Impact Ionization and Carrier Multiplication in Graphene

L. Pirro, A. Girdhar, Y. Leblebici, J. P. Leburton

摘要:

我们开发了一个模型,在石墨烯中的碰撞电离产生的载流子,这表明,这种影响是不可忽略的,因为消失的能隙,即使是在中等电场中的载流子传输。我们的理论应用于石墨烯场效应晶体管,对于石墨烯场效应晶体管,我们参数化先前用玻尔兹曼形式主义获得的载流子生成速率[A. Girdhar和J. Leburton,Appl. Phys. Lett. 99,229903(2011)]中,以将其包括在自洽方案中并计算晶体管I-V特性。我们的模型表明,漏极电流表现出“向上踢”在高漏极偏压,这是与最近的实验数据相一致。我们还表明,载流子的产生影响沿晶体管沟道的电场分布,这反过来又降低了载流子的速度。

英文摘要:

We develop a model for carrier generation by impact ionization in graphene, which shows that this effect is non-negligible because of the vanishing energy gap, even for carrier transport in moderate electric fields. Our theory is applied to graphene field effect transistors for which we parametrize the carrier generation rate obtained previously with the Boltzmann formalism [A. Girdhar and J. Leburton, Appl. Phys. Lett. 99, 229903 (2011)] to include it in a self-consistent scheme and compute the transistor I-V characteristics. Our model shows that the drain current exhibits an "up-kick" at high drain biases, which is consistent with recent experimental data. We also show that carrier generation affects the electric field distribution along the transistor channel, which in turn reduces the carrier velocity.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑