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arXiv 1105.1801cond-mat.mes-hall
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石墨烯双层膜电容作为哪层探针的研究

Capacitance of Graphene Bilayer as a Which-Layer Probe

Andrea F. Young, Leonid S. Levitov

摘要:

双层石墨烯中电容测量的独特能力使得能够探测通常在传输测量中无法达到的层特定性质。此外,在顶栅和渗透场的几何形状的电容测量是敏感的不同的物理量:渗透场电容探测两个层相等,而顶栅电容优先采样近层,导致在最近的顶栅电容测量中观察到的“近层电容增强”的效果。我们提出了一个详细的理论描述,这种效果,并表明电容可以用来确定平衡层的极化,一个潜在的有用的工具,在石墨烯的对称性破缺状态的研究。

英文摘要:

The unique capabilities of capacitance measurements in bilayer graphene enable probing of layer-specific properties that are normally out of reach in transport measurements. Furthermore, capacitance measurements in the top-gate and penetration field geometries are sensitive to different physical quantities: the penetration field capacitance probes the two layers equally, whereas the top gate capacitance preferentially samples the near layer, resulting in the "near-layer capacitance enhancement" effect observed in recent top-gate capacitance measurements. We present a detailed theoretical description of this effect and show that capacitance can be used to determine the equilibrium layer polarization, a potentially useful tool in the study of broken symmetry states in graphene.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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