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arXiv 1005.0946cond-mat.mtrl-scicond-mat.mes-hall
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(Ga,Mn)(As,P)器件中宽温度范围内电流驱动的畴壁运动

Current-driven domain wall motion across a wide temperature range in a (Ga,Mn)(As,P) device

K. Y. Wang, K. W. Edmonds, A. C. Irvine, G. Tatara, E. De Ranieri, J. Wunderlich, K. Olejnik, A. W. Rushforth, R. P. Campion, D. A. Williams, C. T. Foxon, B. L. Gallagher

摘要:

电流驱动的磁畴壁运动在四元铁磁半导体(Ga,Mn)(As,P)中得到了证实,其温度远低于铁磁转变温度,临界电流为10 ^5 Acm ^-2量级。这是通过与在应变弛豫缓冲层上生长的(Ga,Mn)As层相比弱得多的畴壁钉扎来实现的。临界电流被证明是与理论预测相媲美。宽的温度范围内,可以实现畴壁运动表明,这是一个很有前途的系统,为发展一个更好的理解自旋转移力矩的系统具有较强的自旋轨道相互作用。

英文摘要:

Current-driven magnetic domain wall motion is demonstrated in the quaternary ferromagnetic semiconductor (Ga,Mn)(As,P) at temperatures well below the ferromagnetic transition temperature, with critical currents of the order 10^5Acm^-2. This is enabled by a much weaker domain wall pinning compared to (Ga,Mn)As layers grown on a strain-relaxed buffer layer. The critical current is shown to be comparable with theoretical predictions. The wide temperature range over which domain wall motion can be achieved indicates that this is a promising system for developing an improved understanding of spin-transfer torque in systems with strong spin-orbit interaction.

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