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arXiv 1503.07668cond-mat.mtrl-sci
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垂直磁化Co薄膜中拓扑保护的同手性畴壁的磁显微术

Magnetic microscopy of topologically protected homochiral domain walls in an ultrathin perpendicularly magnetized Co film

Maria Jose Benitez, Ales Hrabec, Andrei P. Mihai, Thomas A. Moore, Gavin Burnell, Damien McGrouther, Christopher H. Marrows, Stephen McVitie

摘要:

下一代固态存储器件的概念是基于电流驱动的畴壁传播,其中畴壁速度决定器件性能。结果表明,畴壁的运动速度和运动方向受畴壁的性质及其手征性的控制。这种手性是由于铁磁体和重金属之间的界面处缺乏反转对称性而产生的效应,导致可以控制磁畴壁的形状和手性的界面Dzyaloshinskiii-Moriya相互作用。在这里,我们提出了直接成像的域壁在Pt/Co/AlO $_x$膜使用洛伦兹透射电子显微镜,证明存在的同手性,从而拓扑保护,Néel墙。这样的畴壁是用于密集数据存储的良好候选者,使位大小下降到接近畴壁宽度的极限。

英文摘要:

Next-generation concepts for solid-state memory devices are based on current-driven domain wall propagation, where the wall velocity governs the device performance. It has been shown that the domain wall velocity and the direction of travel is controlled by the nature of the wall and its chirality. This chirality is attributed to effects emerging from the lack of inversion symmetry at the interface between a ferromagnet and a heavy metal, leading to an interfacial Dzyaloshinskii-Moriya interaction that can control the shape and chirality of the magnetic domain wall. Here we present direct imaging of domain walls in Pt/Co/AlO$_x$ films using Lorentz transmission electron microscopy, demonstrating the presence of homochiral, and thus topologically protected, Néel walls. Such domain walls are good candidates for dense data storage, bringing the bit size down close to the limit of the domain wall width.

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