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arXiv 1004.2052cond-mat.mtrl-sci
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近四方BiFeO3薄膜的纳米开关特性

Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films

Dipanjan Mazumdar, Vilas Shelke, Milko Iliev, Stephen Jesse, Amit Kumar, Sergei Kalinin, Arthur Baddorf, Arunava Gupta

摘要:

我们已经研究了纳米开关性能的应变工程BiFeO 3薄膜沉积在LaAlO 3衬底上使用扫描探针技术的组合。偏振拉曼光谱分析表明,近四斜晶系薄膜具有单斜(Cc)对称性,而不是P4mm四斜晶系。通过本地开关光谱测量和piezoresponse力显微镜,我们提供了明确的证据,铁电开关的tetraxite相,但极化方向,因此它的开关,强烈偏离预期的(001)tetraxite轴。我们还证明了一个大的和可逆的,电驱动的结构相变从四面体的菱形多晶型在这种材料是有希望的大量的应用。

英文摘要:

We have investigated the nanoscale switching properties of strain-engineered BiFeO3 thin films deposited on LaAlO3 substrates using a combination of scanning probe techniques. Polarized Raman spectral analysis indicate that the nearly-tetragonal films have monoclinic (Cc) rather than P4mm tetragonal symmetry. Through local switching-spectroscopy measurements and piezoresponse force microscopy we provide clear evidence of ferroelectric switching of the tetragonal phase but the polarization direction, and therefore its switching, deviates strongly from the expected (001) tetragonal axis. We also demonstrate a large and reversible, electrically-driven structural phase transition from the tetragonal to the rhombohedral polymorph in this material which is promising for a plethora of applications.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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