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arXiv 0704.2441cond-mat.mtrl-sci
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超薄铁电薄膜极化与厚度关系的直接观察

Direct Observation of Polarization vs. Thickness Relation in Ultra-Thin Ferroelectric Films

Rene Meyer, Arturas Vailionis, Paul. C. McIntyre

摘要:

超薄铁电薄膜中极化的降低似乎是纳米级铁电性的基础。对于模型系统PbTiO 3的SrTiO 3,我们报告观察的极化与厚度的关系。从X射线衍射和总能量计算得到的铁电畴的明显的周期性变化揭示了在临界厚度~12 nm以下的极化的线性降低。独立的极化和四方性测量提供了深入了解纳米铁电体中极化和四方性之间的基本关系。

英文摘要:

A reduction of polarization in ultra-thin ferroelectric films appears to be fundamental to ferroelectricity at the nanoscale. For the model system PbTiO3 on SrTiO3, we report observation of the polarization vs. thickness relation. Distinct periodicity changes of ferroelectric domains obtained from x-ray diffraction and total energy calculations reveal a linear lowering of the polarization below a critical thickness of ~12 nm. Independent polarization and tetragonality measurements provide insight into the fundamental relation between polarization and tetragonality in nanoscale ferroelectrics.

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