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arXiv 1002.0719cond-mat.mtrl-scicond-mat.mes-hall
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硅纳米线的形变势与电子-声子耦合

Deformation Potentials and Electron-Phonon Coupling in Silicon Nanowires

F. Murphy-Armando, G. Fagas, J. C. Greer

AI总结:

本研究基于第一性原理分析硅纳米线中电子-声子耦合,发现维度降低根本改变形变势行为并引发呼吸模式耦合,导致[110]纳米线迁移率为[100]的6倍。

摘要:

硅纳米线中维度降低和表面对电子-声子(e-ph)耦合的作用通过第一性原理确定。表面终止和化学性质的影响相对较小,而维度降低从根本上改变了形变势的行为。因此,出现了电子与“呼吸模式”的耦合,这无法用常规的e-ph耦合处理来描述。这对散射长度和迁移率等物理性质有显著影响:[110]生长纳米线的迁移率是[100]纳米线的6倍,如果没有我们发现的硅纳米线形变势形式,这一效应无法预测。

英文摘要:

The role of reduced dimensionality and of the surface on electron-phonon (e-ph) coupling in silicon nanowires is determined from first principles. Surface termination and chemistry is found to have a relatively small influence, whereas reduced dimensionality fundamentally alters the behavior of deformation potentials. As a consequence, electron coupling to "breathing modes" emerges that cannot be described by conventional treatments of e-ph coupling. The consequences for physical properties such as scattering lengths and mobilities are significant: the mobilities for [110] grown wires are 6 times larger than those for [100] wires, an effect that cannot be predicted without the form we find for Si nanowire deformation potentials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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