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arXiv 0910.5764cond-mat.mtrl-sci
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晶体中声子的非弹性X射线散射

Phonons in Crystals using Inelastic X-Ray Scattering

Alfred Q. R. Baron

摘要:

使用非弹性X射线散射(IXS)研究晶体中的声子和声子色散开辟了声子光谱学领域,允许对微小样品进行测量:微克材料或直径约10至100微米的单晶就足够了。在这里,我们审查的技术,因为它是在实践中的BL 35 XU的春天-8,在兵库县。介绍是针对潜在的IXS用户,突出了独特的和有利的方面的技术。目前的工作,包括几个例子的实验,和未来的方向进行了讨论。

英文摘要:

The use of inelastic x-ray scattering (IXS) to investigate phonons and phonon dispersion in crystals opens the field of phonon spectroscopy, allowing measurements on tiny samples: micrograms of material, or single crystals ~10 to 100 micron diameter are sufficient. Here we review the technique as it is practiced at BL35XU of SPring-8, in Hyogo prefecture. An introduction is provided that is aimed at potential IXS users, highlighting the unique and advantageous aspects of the technique. Present work, including several example experiments, and future directions are discussed.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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