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arXiv 1010.3565cond-mat.str-elcond-mat.mtrl-sci
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用共振非弹性X射线散射确定关联电子系统中的电子-声子耦合强度

Determining the Electron-Phonon Coupling Strength in Correlated Electron Systems from Resonant Inelastic X-ray Scattering

Luuk J. P. Ament, Michel van Veenendaal, Jeroen van den Brink

摘要:

我们表明,高分辨率共振非弹性X射线散射(RIXS)提供了直接的,元素特定的和动量分辨的电子-声子(e-p)耦合强度的信息。我们的理论分析表明,e-p耦合可以从RIXS谱中提取通过确定的微分声子散射截面。另一种提取耦合的非常直接的方法是使用一个和两个声子的损失比,这取决于e-p耦合强度和芯-空穴寿命。这允许在绝对能量标度上测量e-p耦合。

英文摘要:

We show that high resolution Resonant Inelastic X-ray Scattering (RIXS) provides direct, element-specific and momentum-resolved information on the electron-phonon (e-p) coupling strength. Our theoretical analysis demonstrates that the e-p coupling can be extracted from RIXS spectra by determining the differential phonon scattering cross section. An alternative, very direct manner to extract the coupling is to use the one and two-phonon loss ratio, which is governed by the e-p coupling strength and the core-hole life-time. This allows measurement of the e-p coupling on an absolute energy scale.

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