arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0909.1205cond-mat.mtrl-sci
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高结晶质量单晶CVD金刚石

High crystalline quality single crystal CVD diamond

P M Martineau, M P Gaukroger, K B Guy, S C Lawson, D J Twitchen, I Friel, J O Hansen, G C Summerton, T P G Addison, R Burns

摘要:

在高压高温(HPHT)合成金刚石基底上的同质外延化学气相沉积(CVD)允许生产具有受控点缺陷含量的金刚石材料。然而,为了使扩展缺陷含量最小化,有必要使到达初始生长表面的衬底扩展缺陷的数量以及CVD层与其衬底之间的界面处的位错成核最小化。X射线形貌已经表明,当使用IIa型HPHT合成衬底时,在界面处成核的位错密度可以小于400 cm-2。X射线形貌,光致发光成像和双折射显微镜的HPHT生长的合成IIa型金刚石清楚地表明,扩展的缺陷含量是生长部门的依赖。<111>扇区包含最高浓度的堆垛层错和位错,但是<100>扇区相对没有堆垛层错和位错。已经表明,这种材料的HPHT处理可以显着减少堆垛层错的面积,并导致位错移动。这种知识,加上对生长部门在HPHT合成过程中如何发展的理解,已被用于指导适合于CVD合成具有高结晶完整性和受控点缺陷含量的材料的衬底的选择和处理。

英文摘要:

Homoepitaxial chemical vapour deposition (CVD) on high pressure high temperature (HPHT) synthetic diamond substrates allows production of diamond material with controlled point defect content. In order to minimize the extended defect content, however, it is necessary to minimize the number of substrate extended defects that reach the initial growth surface and the nucleation of dislocations at the interface between the CVD layer and its substrate. X-ray topography has indicated that when type IIa HPHT synthetic substrates are used the density of dislocations nucleating at the interface can be less than 400 cm-2. X-ray topography, photoluminescence imaging and birefringence microscopy of HPHT grown synthetic type IIa diamond clearly show that the extended defect content is growth sector dependent. <111> sectors contain the highest concentration of both stacking faults and dislocations but <100> sectors are relatively free of both. It has been shown that HPHT treatment of such material can significantly reduce the area of stacking faults and cause dislocations to move. This knowledge, coupled with an understanding of how growth sectors develop during HPHT synthesis, has been used to guide selection and processing of substrates suitable for CVD synthesis of material with high crystalline perfection and controlled point defect content.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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