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arXiv 0908.3960cond-mat.mes-hallcond-mat.mtrl-sci
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测量(Ga,Mn)As磁和磁阻各向异性系数的低场技术

A low field technique for measuring magnetic and magneto-resistance anisotropy coefficients applied to (Ga,Mn)As

J A Haigh, A W Rushforth, C S King, K W Edmonds, R P Campion, C T Foxon, B L Gallagher

摘要:

我们展示了一种简单,低成本,磁输运方法快速表征的磁各向异性和各向异性磁阻(AMR)的铁磁器件与单轴磁各向异性。这种传输技术是散装材料的磁化率测量的模拟,但适用于非常小的样品与低的总力矩。该技术被用来表征从稀磁半导体(Ga,Mn)As制造的器件。该技术使我们能够探测接近居里温度的参数的行为,在所施加的磁场趋于零的限制。这避免了顺磁性的存在所引起的复杂性。

英文摘要:

We demonstrate a simple, low cost, magneto-transport method for rapidly characterizing the magnetic anisotropy and anisotropic magneto-resistance (AMR) of ferromagnetic devices with uniaxial magnetic anisotropy. This transport technique is the analogue of magnetic susceptibility measurements of bulk material but is applicable to very small samples with low total moment. The technique is used to characterize devices fabricated from the dilute magnetic semiconductor (Ga,Mn)As. The technique allows us to probe the behavior of the parameters close to the Curie temperature, in the limit of the applied magnetic field tending to zero. This avoids the complications arising from the presence of paramagnetism.

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