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arXiv 0908.3132cond-mat.stat-mech
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二维横场Ising和XXZ模型的保真度磁化率

Fidelity susceptibility in the two-dimensional transverse field Ising and XXZ models

Wing-Chi Yu, Ho-Man Kwok, Junpeng Cao, Shi-Jian Gu

摘要:

本文用数值方法研究了二维横场伊辛模型和二维XXZ模型中的保真度磁化率。结果发现,在这两个模型中,作为驱动参数的函数的保真度磁化率在临界点处发散。这两个模型验证了量子相变对信号保真度敏感度的有效性。我们还比较了保真度磁化率极值与基态能量二阶导数极值的标度行为。这些结果也证明了保真度磁化率是二阶量子相变更灵敏的探测器的理论观点。

英文摘要:

We study the fidelity susceptibility in the two-dimensional(2D) transverse field Ising model and the 2D XXZ model numerically. It is found that in both models, the fidelity susceptibility as a function of the driving parameter diverges at the critical points. The validity of the fidelity susceptibility to signal for the quantum phase transition is thus verified in these two models. We also compare the scaling behavior of the extremum of the fidelity susceptibility to that of the second derivative of the ground state energy. From those results, the theoretical argument that fidelity susceptibility is a more sensitive seeker for a second order quantum phase transition is also testified in the two models.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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