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arXiv 0812.0897cond-mat.mtrl-sci
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铁电薄膜的短、中、长时间保持模型

A model for retention on short, intermediate and long time-scale in ferroelectric thin films

X. J. Lou

摘要:

建立了一个无可调参数的铁电薄膜电容器的短时和长时保持损耗模型。我们发现,该模型的预测与文献中的实验观察结果吻合得很好。特别是,它解释了为什么幂律函数在短时间尺度(10^-7 s到1 s)上比线性对数关系更好地拟合,以及为什么拉伸指数关系在长时间尺度(>100 s)上比线性对数图更精确地描述,正如许多研究人员在过去所报道的那样。更严重的保留损失,在较高的温度下,在较薄的膜也被正确地预测本理论。

英文摘要:

We developed a model with no adjustable parameter for retention loss at short and long time scale in ferroelectric thin-film capacitors. We found that the predictions of this model are in good agreement with the experimental observations in the literature. In particular, it explains why a power-law function shows better fitting than a linear-log relation on a short time scale (10^-7 s to 1 s) and why a stretched exponential relation gives more precise description than a linear-log plot on a long time scale (>100 s), as reported by many researchers in the past. More severe retention losses at higher temperatures and in thinner films have also been correctly predicted by the present theory.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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