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arXiv 1507.04864cond-mat.mtrl-sci
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半导体六角铁电TbMnO $_3$薄膜的畴壁电导

Domain wall conductivity in semiconducting hexagonal ferroelectric TbMnO$_3$ thin films

D. J. Kim, J. G. Connell, S. S. A. Seo, A. Gruverman

摘要:

虽然在BiFeO $_3$薄膜、Pb(Zr,Ti)O $_3$薄膜和六方晶系稀土锰氧化物单晶中发现了铁电畴界的增强导电性,但畴壁导电性的机理仍有争议。使用导电原子力显微镜,我们观察到增强的电导在半导体六方晶系铁电TbMnO $_3$薄膜的结构和极化方向强烈约束沿c轴的电中性畴壁。这一结果表明,在铁电稀土锰氧化物的畴壁电导率不限于带电畴壁。我们发现,所观察到的TbMnO $_3$膜的导电性是由一个单一的导电机制,即,背靠背肖特基二极管模型调整的隔离缺陷。

英文摘要:

Although enhanced conductivity at ferroelectric domain boundaries has been found in BiFeO$_3$ films, Pb(Zr,Ti)O$_3$ films, and hexagonal rare-earth manganite single crystals, the mechanism of the domain wall conductivity is still under debate. Using conductive atomic force microscopy, we observe enhanced conductance at the electrically-neutral domain walls in semiconducting hexagonal ferroelectric TbMnO$_3$ thin films where the structure and polarization direction are strongly constrained along the c-axis. This result indicates that domain wall conductivity in ferroelectric rare-earth manganites is not limited to charged domain walls. We show that the observed conductivity in the TbMnO$_3$ films is governed by a single conduction mechanism, namely, the back-to-back Schottky diodes model tuned by the segregation of defects.

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