arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1001.4447cond-mat.mtrl-scicond-mat.str-el
收藏

基于氧化物薄膜和人工异质外延多层膜的新型多功能材料

Novel Multifunctional Materials Based on Oxide Thin Films and Artificial Heteroepitaxial Multilayers

Matthias Opel, Stephan Gepraegs, Edwin P. Menzel, Andrea Nielsen, Daniel Reisinger, Karl-Wilhelm Nielsen, Andreas Brandlmaier, Franz D. Czeschka, Matthias Altha… 展开作者

Matthias Opel, Stephan Gepraegs, Edwin P. Menzel, Andrea Nielsen, Daniel Reisinger, Karl-Wilhelm Nielsen, Andreas Brandlmaier, Franz D. Czeschka, Matthias Althammer, Mathias Weiler, Sebastian T. B. Goennenwein, Juergen Simon, Matthias Svete, Wentao Yu, Sven-Martin Huehne, Werner Mader, Rudolf Gross

摘要:

过渡金属氧化物具有高温超导性、铁磁性、反铁磁性、铁电性甚至多铁性等优良的物理性质。氧化物薄膜技术的巨大进步使我们能够将这些材料与半导体、正常导电、介电或非线性光学氧化物集成在复杂的氧化物异质结构中,为新型多功能材料和各种器件应用提供了基础。在这里,我们报告的组合铁磁,半导体,金属和介电材料的性能在薄膜和人工异质结构,使用激光分子束外延。我们讨论了氧化物为基础的铁磁隧道结,过渡金属-杂质半导体,本征多铁性和人工铁电/铁磁异质结构的制造和表征-后者允许应变效应的详细研究,形成自旋力学的基础。对于表征,我们使用X射线衍射,SQUID磁强计,磁输运测量,和先进的方法,透射电子显微镜的目标是相关的宏观物理性能与微观结构的薄膜和异质结构。

英文摘要:

Transition metal oxides show fascinating physical properties such as high temperature superconductivity, ferro- and antiferromagnetism, ferroelectricity or even multiferroicity. The enormous progress in oxide thin film technology allows us to integrate these materials with semiconducting, normal conducting, dielectric or non-linear optical oxides in complex oxide heterostructures, providing the basis for novel multi-functional materials and various device applications. Here, we report on the combination of ferromagnetic, semiconducting, metallic, and dielectric materials properties in thin films and artificial heterostructures using laser molecular beam epitaxy. We discuss the fabrication and characterization of oxide-based ferromagnetic tunnel junctions, transition metal-doped semiconductors, intrinsic multiferroics, and artificial ferroelectric/ferromagetic heterostructures - the latter allow for the detailed study of strain effects, forming the basis of spin-mechanics. For characterization we use X-ray diffraction, SQUID magnetometry, magnetotransport measurements, and advanced methods of transmission electron microscopy with the goal to correlate macroscopic physical properties with the microstructure of the thin films and heterostructures.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑