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arXiv 0809.5160physics.optics
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用于X射线显微术的光学元件

Optical element for X-ray microscopy

G. Chadzitaskos

摘要:

我们提出了一种适用于X射线显微镜和其他基于X射线的显示系统的X射线光学元件的建议。其原理是基于X射线在单晶片上散射的菲涅耳透镜条件和布拉格条件。由于单晶的适当加工形状在其端部具有应力,这些条件同时满足。

英文摘要:

We present a proposal for a X-ray optical element suitable for X-ray microscopy and other X-ray-based display systems. Its principle is based on the Fresnel lenses condition and the Bragg condition for X-ray scattering on a slice of monocrystal. These conditions are fulfilled simultaneously due to a properly machined shape of the monocrystal with a stress at its ends.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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