Photoinduced Magnetic Force Microscopy：实现光磁的直接和排他性检测
Photoinduced Magnetic Force Microscopy: Enabling Direct and Exclusive Detection of Optical Magnetism
摘要：
现代光学纳米元件追求更小的尺寸和个性化的功能。这些元件可以有效地操纵光的磁场，具有广阔的应用前景和巨大的挑战：磁近场是无法从传统的光学远场表征。在这里，我们提出了光致磁力显微镜直接和专门感测的磁场的光在纳米尺度。所提出的仪器利用了结构光照明下具有排他性磁激发的磁性纳米探针。磁性纳米探针检测光致磁力，其被定义为施加在纳米探针中的光致磁偶极子上的偶极洛伦兹力。由于所产生的磁力与入射磁场成比例，所测量的力揭示了纳米尺度下的磁近场分布。拟议的仪器代表了一个基本的一步，全面的电和磁近场检测和/或操纵在单个纳米元件的光学设备。
英文摘要：
Modern optical nano-elements pursue ever-smaller sizes and individualized functionalities. Those elements that can efficiently manipulate the magnetic field of light boast promising future applications with a great challenge: the magnetic near field is irretrievable from conventional optical far-field characterization. Here we propose photoinduced magnetic force microscopy to directly and exclusively sense the magnetic field of light at the nanoscale. The proposed instrument exploits a magnetic nanoprobe with exclusive magnetic excitation under structured light illumination. The magnetic nanoprobe detects the photoinduced magnetic force, which is defined as the dipolar Lorentz force exerted on the photoinduced magnetic dipole in the nanoprobe. Since the resulting magnetic force is proportional to the incident magnetic field, the measured force reveals the magnetic near-field distribution at the nanoscale. The proposed instrument represents a fundamental step towards comprehensive electric and magnetic near-field detection and/or manipulation in single nano-element optical devices.
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