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arXiv 0803.4287cond-mat.mtrl-sci
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半导体自由表面附近的1/f噪声

1/f noise near the free surface of a semiconductor

Tomasz Blachowicz

摘要:

本文描述了在自由半导体表面下的耗尽区中产生的所谓1/f噪声。结果表明,1/f噪声,它可以通过带弯曲控制,和非常窄的能量状态(E<<kT)位于顶面和消失到体区域之间的联系。此外,它表明,当频带弯曲减少时,可以降低噪声。提供了这种减少的定量说明。本研究考虑了n型半导体。

英文摘要:

This paper describes the so-called 1/f noise generated within the depleted region below a free semiconducting surface. It was shown that there is a link between the 1/f noise, which can be controlled by the band-bending, and the very narrow energy states (E<<kT) located on the top surface and vanishing into the bulk region. Also, it was shown that the noise can be lowered when the band-bending is reduced. A quantitative description of this reduction was provided. This study considered the n-type semiconductor.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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