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arXiv 0810.0995cond-mat.mtrl-sci
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外噪声对半导体中电子速度涨落的影响

External noise effects on the electron velocity fluctuations in semiconductors

D. Persano Adorno, N. Pizzolato, B. Spagnolo

摘要:

本文研究了在低杂质半导体材料中引入外部相关噪声源,外加高频周期性电场,对材料的本征载流子噪声谱密度的影响。采用Monte Carlo方法数值求解输运方程,考虑了超热电子在介质中所有可能的散射现象。我们发现,噪声谱的强烈影响的强度和相关时间的外部随机电场。此外,该随机场可以引起总噪声功率的抑制。

英文摘要:

We investigate the modification of the intrinsic carrier noise spectral density induced in low-doped semiconductor materials by an external correlated noise source added to the driving high-frequency periodic electric field. A Monte Carlo approach is adopted to numerically solve the transport equation by considering all the possible scattering phenomena of the hot electrons in the medium. We show that the noise spectra are strongly affected by the intensity and the correlation time of the external random electric field. Moreover this random field can cause a suppression of the total noise power.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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