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arXiv 2401.12432cond-mat.mtrl-scicond-mat.mes-hall
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准二维范德华反铁磁半导体的电子噪声谱学

Electronic Noise Spectroscopy of Quasi-2D van der Waals Antiferromagnetic Semiconductors

Subhajit Ghosh, Zahra Ebrahim Nataj, Fariborz Kargar, Alexander A. Balandin

AI总结:

本文通过垂直器件的电子噪声谱研究FePS3,区分磁相变相关洛伦兹峰与陷阱辅助产生—复合噪声,揭示奈尔温度附近自旋重构效应。

摘要:

我们研究了FePS3范德华层状反铁磁半导体中的低频电流涨落,即电子噪声。噪声测量被用作噪声谱学,以对受自旋有序和陷阱态影响的电荷载流子动力学进行先进材料表征。由于该材料具有高电阻率,我们在垂直器件构型上开展了测量。测得的噪声谱揭示了两种不同来源的显著洛伦兹峰。其中一个峰仅在奈尔温度附近被观察到,并被归因于相应的磁相变。第二个洛伦兹峰在整个测量温度范围内均可见,具有与传统半导体中类似的陷阱辅助产生—复合过程特征,但在奈尔温度附近表现出明显的自旋有序重构效应。所得结果有助于理解此类反铁磁半导体中的电子和自旋动力学,并展示了电子噪声谱学用于先进材料表征的潜力。

英文摘要:

We investigated low-frequency current fluctuations, i.e. electronic noise, in FePS3 van der Waals, layered antiferromagnetic semiconductor. The noise measurements have been used as noise spectroscopy for advanced materials characterization of the charge carrier dynamics affected by spin ordering and trapping states. Owing to the high resistivity of the material, we conducted measurements on vertical device configuration. The measured noise spectra reveal pronounced Lorentzian peaks of two different origins. One peak is observed only near the Neel temperature and it is attributed to the corresponding magnetic phase transition. The second Lorentzian peak, visible in the entire measured temperature range, has the characteristics of the trap-assisted generation-recombination processes similar to those in conventional semiconductors but shows a clear effect of the spin order reconfiguration near the Neel temperature. The obtained results contribute to understanding the electron and spin dynamics in this type of antiferromagnetic semiconductors and demonstrate the potential of electronic noise spectroscopy for advanced materials characterization.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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