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arXiv 0710.0877cond-mat.mtrl-sci
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石墨烯薄膜在SiC(0001)上生长的形态

Morphology of graphene thin film growth on SiC(0001)

Taisuke Ohta, Farid El Gabaly, Aaron Bostwick, Jessica McChesney, Konstantin V. Emtsev, Andreas K. Schmid, Thomas Seyller, Karsten Horn, Eli Rotenberg

摘要:

石墨烯在SiC(0001)上的外延膜从基础物理学以及面向应用的观点来看是有趣的。在这里,我们使用低能电子显微镜(LEEM)和角分辨光电发射(ARPES)研究在真空中制备的石墨烯薄膜的新兴形态。我们通过比较LEEM中电子反射谱的特征与ARPES所揭示的PI-能带结构来识别单层和双层石墨烯膜。我们证明,LEEM作为一种工具,以准确地确定石墨烯层的局部范围以及层厚度。

英文摘要:

Epitaxial films of graphene on SiC(0001) are interesting from a basic physics as well as applications-oriented point of view. Here we study the emerging morphology of in-vacuo prepared graphene films using low energy electron microscopy (LEEM) and angle-resolved photoemission (ARPES). We obtain an identification of single and bilayer of graphene film by comparing the characteristic features in electron reflectivity spectra in LEEM to the PI-band structure as revealed by ARPES. We demonstrate that LEEM serves as a tool to accurately determine the local extent of graphene layers as well as the layer thickness.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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