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arXiv 0708.1844cond-mat.mtrl-sci
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多晶硅低温导电特性的模拟与实验研究

Low Temperature Investigation of Electrical Conduction in Polysilicon: Simulation and Experiment

S. Ecoffey, S. Mahapatra, V. Pott, D. Bouvet, G. Reimbold, A. -M. Ionescu

摘要:

基于Monte Carlo(MC)模拟和4K ~ 300 K温度范围内的电学测量,研究了具有纳米晶粒(5 ~ 20 nm)的多晶硅纳米线(polySiNW)的导电特性。在低于200 K的温度下观察到一些不规则的库仑振荡(CO),由于晶粒尺寸的随机分布(5- 20 nm),表现出几个周期宽度。一个显着的结果包括在更有效的振荡观察到在中间范围内的温度(25 K和150 K之间)和高漏极电压。CO的温度依赖性的解释的事实是,在一个多个不对称的点系统在低温下,CO被观察到不是在最低,但在中间温度范围内,而漏极电压的依赖性是由于增强的非共振隧穿。MC模拟证实了实验观察。

英文摘要:

Investigation of electrical conduction in polysilicon nanowires (polySiNW) with nanograins (5 to 20nm), based on Monte Carlo (MC) simulations and electrical measurements from 4K to 300K are presented. Some irregular Coulomb Oscillations (CO) are observed at temperatures lower than 200K showing several period widths due to the random distribution in grain size (5-20nm). A remarkable result consists in more effective oscillations observed at intermediate range of temperatures (between 25K and 150K) and high drain voltages. The temperature dependence of COs is explained by the fact that in a multiple asymmetric dot system at low temperature, COs are observed not at the lowest but at an intermediate temperature range, whereas the drain voltage dependence is due to an enhanced non-resonant tunneling. MC simulations have confirmed experimental observations.

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