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arXiv 2512.03372cond-mat.mtrl-sciphysics.app-ph
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关于二维材料中原子分辨率静电测量精度的准确性

On the Accuracy of Atomic Resolution Electrostatic Measurements in 2D Materials

INL – International Iberian Nanotechnology Laboratory(国际伊比利亚纳米技术实验室);Mechanical Engineering Department and IDMEC, Instituto Superior Técnico, University of Lisbon(里斯本大学高等理工学院机械工程系及IDMEC);Departamento de Física de Materiales, Universidad Complutense de Madrid(马德里康普顿斯大学材料物理系);Instituto Pluridisciplinar, Universidad Complutense de Madrid(马德里康普顿斯大学多学科研究所);Department of Materials Science and Engineering, Carnegie Mellon University(卡内基梅隆大学材料科学与工程系)

Rafael V. Ferreira, Sebastian Calderon V., Paulo J. Ferreira

AI总结:

本研究通过模拟评估了STEM中关键仪器参数对原子分辨率DPC测量精度的影响,发现失焦和像散会导致静电场低估,强调优化仪器对准的重要性。

摘要:

在扫描透射电子显微镜(STEM)中使用差分相位对比(DPC)技术,已显示出直接研究材料系统功能性质的巨大潜力,利用电子探针与原子尺度电场之间的自然耦合来映射样品中的静电配置。然而,这些测量的高灵敏度使其特别容易受到样品性质和仪器配置变化的影响,强调了需要稳健的方法来确保更准确的分析。在本工作中,通过广泛的图像模拟评估了关键仪器参数——探针收敛角、失焦和两倍像散——对原子分辨率分段探测器DPC-STEM测量的影响。结果表明,21毫弧度失焦探针的可解释极限为4纳米,其中在过焦情况下静电场幅度可能被低估约16%,在欠焦情况下则略高于10%。对于30毫弧度探针,过焦情况下低估值约为30%,欠焦情况下为20%,在更低的可解释极限3纳米处。两倍像散引入了方向依赖的变化,对于低于3纳米的幅度,变化超过40%,但当沿着探测器段边缘方向时,对像散的敏感性有所降低。总体而言,分析确认了基于散点图的方法的敏感性和实用性,并强调了优化仪器对准对于准确CoM基于STEM成像的重要性。

英文摘要:

The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the electron probe and atomic-scale electric fields to map the electrostatic configuration within a sample. However, the high sensitivity of these measurements makes them particularly vulnerable to variations in both sample properties and the configuration of the instrument, stressing the need for robust methodologies to ensure more accurate analyses. In this work, the influence of key instrumental parameters - probe convergence angle, defocus and two-fold astigmatism - on atomic-resolution segmented-detector DPC-STEM measurements is evaluated through extensive image simulations. Results show that the limit of interpretability for a 21 mrad defocused probe is found at a magnitude of 4 nm, where electrostatic field magnitude can be underestimated by about 16 % in overfocus and just above 10 % in underfocus. Equivalent results for a 30 mrad probe demonstrate underestimated values around 30 % at overfocus and 20 % for underfocus, at a lower interpretability limit of 3 nm. Two-fold astigmatism introduces orientation dependent variations that surpass 40 % for magnitudes below 3 nm, but a reduction in sensitivity to the aberration is observed when oriented along detector-segment edges. Overall, the analysis confirms the sensitivity and usefulness of the scattergram-based method and underscores the importance of optimized instrumental alignment for accurate CoM based STEM imaging.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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