通过传导原子力显微镜在环境条件下实现真正的原子分辨率成像
True Atomic-Resolution Imaging under Ambient Conditions via Conductive Atomic Force Microscopy
摘要：
表面的原子尺度特征决定了从催化到摩擦等众多科学现象的原理。尽管如此，我们在原子尺度上可视化和改变表面的能力仍然受到相关方法实现高空间分辨率的严格条件的严重阻碍。特别是，用于实现原子分辨率成像的两种主要方法-扫描隧道显微镜（STM）和非接触式原子力显微镜（NC-AFM）-通常在超高真空（UHV）下进行，并且通常在低温下进行。也许更重要的是，在这种良好控制的原始条件下获得的结果与通常在环境条件下发生的大多数过程和应用几乎没有相关性。因此，一种可以在环境条件下在原子尺度上对表面进行鲁棒成像的方法长期以来一直被认为是表面科学的“圣杯”。在这里，通过对二硫化钼（MoS 2）的原理验证测量，我们报告说，导电原子力显微镜（C-AFM）的方法可以用于在环境条件下实现真正的原子分辨率成像，如通过单个原子空位的成像所证明的那样，而无需对操作环境或精细的样品制备进行任何控制。虽然这一显着的观察背后的物理机制尚未阐明，我们的方法克服了许多与STM和NC-AFM相关的经典限制，研究结果预示着C-AFM作为一个强大的工具，在环境条件下的原子分辨率成像的潜在出现。
英文摘要：
Atomic-scale characteristics of surfaces dictate the principles governing numerous scientific phenomena ranging from catalysis to friction. Despite this fact, our ability to visualize and alter surfaces on the atomic scale is severely hampered by the strict conditions under which the related methods are operated to achieve high spatial resolution. In particular, the two prominent methods utilized to achieve atomic-resolution imaging - scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) - are typically performed under ultrahigh vacuum (UHV) and often at low temperatures. Perhaps more importantly, results obtained under such well-controlled, pristine conditions bear little relevance for the great majority of processes and applications that often occur under ambient conditions. As such, a method that can robustly image surfaces on the atomic scale under ambient conditions has long been thought of as a "holy grail" of surface science. Here, by way of a proof-of-principle measurement on molybdenum disulfide (MoS2), we report that the method of conductive atomic force microscopy (C-AFM) can be utilized to achieve true atomic-resolution imaging under ambient conditions as proven by the imaging of a single atomic vacancy, without any control over the operational environment or elaborate sample preparation. While the physical mechanisms behind this remarkable observation are not elucidated yet, our approach overcomes many of the classical limitations associated with STM and NC-AFM, and the findings herald the potential emergence of C-AFM as a powerful tool for atomic-resolution imaging under ambient conditions.
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