arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1503.07738cond-mat.mes-hallcond-mat.mtrl-sci
收藏

扫描量子点显微术

Scanning Quantum Dot Microscopy

Christian Wagner, Matthew F. B. Green, Phillipp Leinen, Thorsten Deilmann, Peter Krüger, Michael Rohlfing, Ruslan Temirov, F. Stefan Tautz

摘要:

原子和分子物体之间的相互作用在很大程度上由这些物体产生的纳米级静电势定义。我们介绍了一种扫描探针技术,使三维成像的局部静电势场与亚纳米分辨率。登记单电子充电事件的分子量子点连接到一个(qPlus音叉)原子力显微镜的尖端在5 K下操作,我们定量测量的四极场的单个分子和一个单一的金属吸附原子的偶极场,都吸附在一个干净的金属表面。由于其高灵敏度,该技术可以记录静电电位在很大的距离,从他们的来源,这首先将有助于图像复杂的样品增加表面粗糙度。

英文摘要:

Interactions between atomic and molecular objects are to a large extent defined by the nanoscale electrostatic potentials which these objects produce. We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with sub-nanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of a (qPlus tuning fork) atomic force microscope operated at 5 K, we quantitatively measure the quadrupole field of a single molecule and the dipole field of a single metal adatom, both adsorbed on a clean metal surface. Because of its high sensitivity, the technique can record electrostatic potentials at large distances from their sources, which above all will help to image complex samples with increased surface roughness.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑