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arXiv 2004.03563cond-mat.mes-hall
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Experimental detection of surface spin-polarized electron accumulation in topological insulators using scanning tunneling microscopy

S. Tyagi, M. Dreyer, D. Bowen, D. Hinkel, P. J. Taylor, A. L. Friedman, R. E. Butera, C. Krafft, I. Mayergoyz

英文摘要:

Spin-momentum locking in the surface mode of topological insulators (TI) leads to the surface accumulation of spin-polarized electrons caused by bias current flows through TI samples. Here, we demonstrate that scanning tunneling microscopy can be used to sense this surface spin-polarized electron accumulation. We present experimental results of this sensing for Sn-doped Bi$_2$Se$_3$ samples by employing Fe-coated W tips as well as non-magnetic W tips. We observe a linear increase in the spin-accumulation as a function of bias current through TI samples.

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