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arXiv 2503.09255cond-mat.mes-hallcond-mat.mtrl-sci
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少层石墨烯角分辨电子反射谱的第一性原理研究

Ab initio study of angle-resolved electron reflection spectroscopy of few-layer graphene

Aleš Paták, Martin Zouhar, Ivo Konvalina, Eliška Materna Mikmeková, Lukáš Průcha, Ilona Müllerová, Anna Charvátová Campbell, Miroslav Valtr, Michal Horák, Vlast… 展开作者

Aleš Paták, Martin Zouhar, Ivo Konvalina, Eliška Materna Mikmeková, Lukáš Průcha, Ilona Müllerová, Anna Charvátová Campbell, Miroslav Valtr, Michal Horák, Vlastimil Křápek, Eugene Krasovskii

AI总结:

本文利用第一性原理研究少层石墨烯的角分辨电子反射谱,纳入非弹性效应,证明该方法可确定层数、堆垛类型及扭转双层中的莫尔图案,且预测对比度足以用于实验检测。

摘要:

我们提出了适用于任意入射角的少层石墨烯电子反射谱的第一性原理理论。非弹性效应通过从电子能量损失谱的第一性原理模拟中获得的光学势以一致的方式纳入。我们证明,即使对于单层石墨烯,非弹性效应也有显著影响。接下来,我们探讨了电子反射谱确定石墨烯特定参数的能力,这些参数不仅包括少层石墨烯中的层数,还包括石墨烯多层中的堆垛类型,以及分辨扭转双层石墨烯中的莫尔图案。我们表明,所预测的对比度虽然因非弹性效应而显著降低,但仍足以通过实验检测所有考虑的参数。我们的理论预测与实验数据(包括我们自己的和最近其他作者发表的)具有良好的一致性,从而证实了我们的发现。

英文摘要:

We present ab initio theory for electron reflection spectroscopy of few-layer graphene for arbitrary angles of incidence. The inelastic effects are included in a consistent way using the optical potential retrieved from ab initio simulations of electron energy-loss spectra. We demonstrate a significant impact of inelastic effects even for single-layer graphene. Next, we address the ability of the electron reflection spectroscopy to determine specific parameters of graphene including not only the number of layers in the few-layer graphene but also the stacking type in the graphene multilayers, and to resolve moiré patterns in twisted graphene bilayers. We show that the predicted contrast, although significantly reduced by inelastic effects, is sufficient for the experimental detection of all considered parameters. Our findings are corroborated by a fair correspondence of our theoretical predictions with experimental data, both our own and recently published by other authors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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