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arXiv 2403.17152cond-mat.supr-con
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超导Sr$_2$RuO$_4$薄膜与环的局部磁响应

Local magnetic response of superconducting Sr$\mathrm{_2}$RuO$\mathrm{_4}$ thin films and rings

G. M. Ferguson, Hari P. Nair, Nathaniel J. Schreiber, Ludi Miao, Kyle M. Shen, Darrell G. Schlom, Katja C. Nowack

AI总结:

利用扫描SQUID磁化率测量法研究Sr$_2$RuO$_4$超导薄膜的局部磁响应,发现低温下磁穿透深度的二次温度依赖性源于散射,并表征了光刻超导环的磁通捕获,为序参量测试铺路。

摘要:

我们使用扫描超导量子干涉仪(SQUID)磁化率测量法,对Sr$_2$RuO$_4$的超导薄膜样品进行了局部磁测量。从抗磁响应中,我们提取了磁穿透深度$λ$,该深度在低温下表现出二次温度依赖性。尽管高纯度块体样品中的二次依赖性被归因于非局域电动力学,但我们的分析表明,在我们的薄膜样品中,散射的存在是这种二次依赖性的根源。虽然我们观察到抗磁响应和超导转变温度存在微米级的变化,但$λ$温度依赖性的形式与位置无关。最后,我们表征了由薄膜光刻制备的超导环中的磁通捕获现象,为基于器件的系统测试Sr$_2$RuO$_4$超导序参量铺平了道路。

英文摘要:

We conduct local magnetic measurements on superconducting thin-film samples of Sr$\mathrm{_2}$RuO$\mathrm{_4}$ using scanning Superconducting Quantum Interference Device (SQUID) susceptometry. From the diamagnetic response, we extract the magnetic penetration depth, $λ$, which exhibits a quadratic temperature dependence at low temperatures. Although a quadratic dependence in high-purity bulk samples has been attributed to non-local electrodynamics, our analysis suggests that in our thin-film samples the presence of scattering is the origin of the quadratic dependence. While we observe micron-scale variations in the diamagnetic response and superconducting transition temperature, the form of the temperature dependence of $λ$ is independent of position. Finally, we characterize flux trapping in superconducting rings lithographically fabricated from the thin films, paving the way to systematic device-based tests of the superconducting order parameter in Sr$\mathrm{_2}$RuO$\mathrm{_4}$.

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