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arXiv 2402.18082cond-mat.supr-con
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通过微波复电导率测量研究极薄 $\mathrm{FeSe}_{1-x}\mathrm{Te}_x$ 薄膜的超导性

Study of superconductivity of very thin $\mathrm{FeSe}_{1-x}\mathrm{Te}_x$ films investigated by microwave complex conductivity measurements

Gaku Matsumoto, Ryo Ogawa, Koji Higasa, Tomoki Kobayashi, Hiroki Nakagawa, Atsutaka Maeda

AI总结:

本文利用微波电场平行于薄膜的新型谐振腔复电导率技术,测量不同 Te 含量的极薄 FeSe$_{1-x}$Te$_x$ 薄膜,揭示向列相边界处超导能隙结构变化及持续至 1.2 $T_c$ 的超导涨落。

摘要:

本文对系统改变组分的 FeSe$_{1-x}$Te$_x$($x$ = 0–0.5)极薄薄膜进行了覆盖整个温度范围(包括 $T_c$ 附近)的复电导率测量。通过采用一种新型谐振腔测量技术,使微波电场平行于 FeSe$_{1-x}$Te$_x$ 薄膜,我们在向列相边界处观察到超流分数和准粒子散射率随温度发生的明显变化。向列相边界处的这些变化表明,处于向列相和非向列相的样品之间超导能隙结构存在差异。此外,无论向列序如何,在高达 1.2 $T_c$ 的温度范围内都可见涨落,这与此前文献 [H. Takahashi 等,Phys. Rev. B 99, 060503(R) (2019)] 和 [F. Nabeshima 等,Phys. Rev. B 97, 024504(R) (2018)] 报道的铁硫族超导体中存在较大超导涨落相一致。

英文摘要:

Complex conductivity measurements spanning the entire temperature range, including the vicinity of $T_c$, were conducted on systematically varied FeSe$_{1-x}$Te$_x$ ($x$ = 0 - 0.5) very thin films. By applying a novel cavity measurement technique employing microwave electric fields parallel to FeSe$_{1-x}$Te$_x$ films, we observed distinct temperature-dependent alterations in superfluid fraction and quasiparticle scattering rate at the nematic boundary. These changes in the nematic boundary suggests variations in the superconducting gap structure between samples in the nematic and non-nematic phase. Moreover, fluctuation is visible up to 1.2 $T_c$ irrespective of nematic order, consistent with large superconducting fluctuations in iron chalcogenide superconductors reported previously in [H. Takahashi $\textit{et al}$, Phys. Rev. B 99, 060503(R) (2019)] and [F. Nabeshima $\textit{et al}$, Phys. Rev. B 97, 024504(R) (2018)].

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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