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arXiv 2402.07091cond-mat.mtrl-sci
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光电金刚石器件中光电流的三维映射与操控

3D-mapping and manipulation of photocurrent in an optoelectronic diamond device

A. A. Wood, D. J. McCloskey, N. Dontschuk, A. Lozovoi, R. M. Goldblatt, T. Delord, D. A. Broadway, J. -P. Tetienne, B. C. Johnson, K. T. Mitchell, C. T. -K. Lew… 展开作者

A. A. Wood, D. J. McCloskey, N. Dontschuk, A. Lozovoi, R. M. Goldblatt, T. Delord, D. A. Broadway, J. -P. Tetienne, B. C. Johnson, K. T. Mitchell, C. T. -K. Lew, C. A. Meriles, A. M. Martin

AI总结:

结合电荷态敏感光学显微与氮空位中心光电探测,实现金刚石光电器件内载流子流动的三维时间分辨成像,并按需光学操控背景杂质电荷态以重构导电通道,为宽禁带定制光电学提供新诊断与操控方法。

摘要:

表征材料中的电荷传输是理解其电学特性的核心,通常只能从电流等导出量的体测量中推断。在宽禁带半导体等新兴电子材料中,建立主体材料杂质与传输性质的联系需要针对这些独特系统量身定制的新诊断方法,而这些材料中存在的光学活性缺陷中心提供了一种非微扰、原位的表征系统。在此,我们将电荷态敏感的光学显微技术与氮空位(NV)中心的光电探测相结合,以三维和具有时间分辨率的方式直接对金刚石光电器件内部的电荷载流子流动进行成像。我们按需光学控制金刚石内部背景杂质的电荷态,导致截然不同的电流流动,例如从器件特定缺陷区域成核的细丝状通道。随后,我们光学工程化构建了控制载流子流动的导电通道,这是迈向光学可重构、宽禁带定制光电学的关键步骤。我们预期该方法可扩展至探测与当前及新兴电子技术相关的其他宽禁带半导体(SiC、GaN)。

英文摘要:

Characterising charge transport in a material is central to the understanding of its electrical properties, and can usually only be inferred from bulk measurements of derived quantities such as current flow. Establishing connections between host material impurities and transport properties in emerging electronics materials, such as wide bandgap semiconductors, demands new diagnostic methods tailored to these unique systems, and the presence of optically-active defect centers in these materials offers a non-perturbative, in-situ characterisation system. Here, we combine charge-state sensitive optical microscopy and photoelectric detection of nitrogen-vacancy (NV) centres to directly image the flow of charge carriers inside a diamond optoelectronic device, in 3D and with temporal resolution. We optically control the charge state of background impurities inside the diamond on-demand, resulting in drastically different current flow such as filamentary channels nucleating from specific, defective regions of the device. We then optically engineered conducting channels that control carrier flow, key steps towards optically reconfigurable, wide bandgap designer optoelectronics. We anticipate our approach might be extended to probe other wide-bandgap semiconductors (SiC, GaN) relevant to present and emerging electronic technologies.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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