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arXiv 2302.06135cond-mat.mes-hallphysics.app-ph
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在低温下利用空穴电流的电子电荷传感器

Electron Charge Sensor with Hole Current Operating at Cryogenic Temperature

Digh Hisamoto, Noriyuki Lee, Ryuta Tsuchiya, Toshiyuki Mine, Takeru Utsugi, Shinichi Saito, Hiroyuki Mizuno

AI总结:

本研究开发了一种结合SOI-NMOS和SOI-PMOS多栅极结构形成硅量子点阵列的电子电荷传感器,通过体偏置效应在5K低温下利用空穴电流实现电子数量的阶梯状感知。

摘要:

当SOI-PMOS像无电容1T-DRAM单元一样工作时,可以在低温(5K)下感知电子数量。我们开发了一种结合SOI-NMOS和SOI-PMOS并具有多个栅极的结构,以形成硅量子点阵列。在此结构中,可变数量的电子被注入SOI-PMOS体中,并通过串联的SOI-NMOS的桶队操作进行传输。由于SOI-PMOS中的体偏置效应,注入的电子改变了沟道空穴电流,且该变化呈阶梯状,表明其对元电荷的依赖性。

英文摘要:

When SOI-PMOS functions like a capacitor-less 1T-DRAM cell, it is possible for the number of electrons to be sensed at cryogenic temperatures (5K). We developed a structure that combines SOI-NMOS and SOI-PMOS with multiple gates to form a silicon quantum-dot array. In this structure, a variable number of electrons is injected into the SOI-PMOS body transporting them by means of the bucket-brigade operation of SOI-NMOS connected in series. The channel-hole current was changed by the injected electrons due to the body bias effect in SOI-PMOS, and the change appeared to be step-like, suggesting a dependence on the elementary charge.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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