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arXiv 2207.14616cond-mat.mes-hall
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堆叠边界的低能电子显微镜对比:比较碳化硅上扭曲少层石墨烯和应变外延石墨烯

Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide

Tobias A. de Jong, Xingchen Chen, Johannes Jobst, Eugene E. Krasovskii, Ruud M. Tromp, Sense Jan van der Molen

摘要:

凡德瓦耳斯异质叠层中,只要后续层之间存在扭转角或晶格失配,就会出现堆叠畴界。这些域边界不仅可以托管拓扑边缘状态,对它们进行成像有助于确定扭曲双层石墨烯中的局部变化。在这里,我们分析的机制造成堆叠域边界对比度在明场低能电子显微镜(BF-LEEM)的SiC上的石墨烯,其中域边界是由应变和扭曲的几层石墨烯。我们表明,当域边界之间的顶部两个石墨烯层,BF-LEEM对比度观察到由于振幅对比度,以及对应于纯粹基于在域边界的局部堆叠的对比度的计算。相反,对于更深的域边界,振幅对比度仅提供了域本身中的不等价叠加之间的微弱区别。然而,对于小的畴相衬,其中来自晶胞的不同部分的电子干涉导致非常强的对比度。我们推导出一个一般的经验法则,预期的BF-LEEM对比度域边界的范德瓦尔斯材料。

英文摘要:

Stacking domain boundaries occur in Van der Waals heterostacks whenever there is a twist angle or lattice mismatch between subsequent layers. Not only can these domain boundaries host topological edge states, imaging them has been instrumental to determine local variations in twisted bilayer graphene. Here, we analyse the mechanisms causing stacking domain boundary contrast in Bright Field Low-Energy Electron Microscopy (BF-LEEM) for both graphene on SiC, where domain boundaries are caused by strain and for twisted few layer graphene. We show that when domain boundaries are between the top two graphene layers, BF-LEEM contrast is observed due to amplitude contrast and corresponds well to calculations of the contrast based purely on the local stacking in the domain boundary. Conversely, for deeper-lying domain boundaries, amplitude contrast only provides a weak distinction between the inequivalent stackings in the domains themselves. However, for small domains phase contrast, where electrons from different parts of the unit cell interfere causes a very strong contrast. We derive a general rule-of-thumb of expected BF-LEEM contrast for domain boundaries in Van der Waals materials.

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