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arXiv 0909.2903cond-mat.mes-hallcond-mat.mtrl-sci
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高迁移率单层外延石墨烯中的半整数量子霍尔效应

Half integer quantum Hall effect in high mobility single layer epitaxial graphene

Xiaosong Wu, Yike Hu, Ming Ruan, Nerasoa K Madiomanana, John Hankinson, Mike Sprinkle, Claire Berger, Walt A. de Heer

摘要:

量子霍尔效应,与$π$的贝里相是在这里证明了在4 H碳化硅的C面上生长的单个石墨烯层。在4 K下的迁移率为$\sim$ 20,000 cm $^2$ /V $\cdot$ s,在300 K下的迁移率为~ 15,000 cm $^2$ /V $\cdot$ s,尽管存在污染和衬底步骤。这与SiO $_2$上的最佳剥离的石墨烯薄片相当,并且比Si面外延石墨烯单层大一个数量级。这些和其他性质表明,C面外延石墨烯是基于石墨烯的电子器件的可行平台。

英文摘要:

The quantum Hall effect, with a Berry's phase of $π$ is demonstrated here on a single graphene layer grown on the C-face of 4H silicon carbide. The mobility is $\sim$ 20,000 cm$^2$/V$\cdot$s at 4 K and ~15,000 cm$^2$/V$\cdot$s at 300 K despite contamination and substrate steps. This is comparable to the best exfoliated graphene flakes on SiO$_2$ and an order of magnitude larger than Si-face epitaxial graphene monolayers. These and other properties indicate that C-face epitaxial graphene is a viable platform for graphene-based electronics.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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