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arXiv 2203.01476cond-mat.mtrl-sci
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用滑移迹线识别多晶体中的活动滑移系--改进的晶格旋转分析(ST-MLRA)

Identification of active slip systems in polycrystals by Slip Trace -- Modified Lattice Rotation Analysis (ST-MLRA)

Biaobiao Yang, Chenying Shi, Ruilin Lai, Dongfeng Shi, Dikai Guan, Gaoming Zhu, Yujie Cui, Guoqiang Xie, Yunping Li, Akihiko Chiba, Javier LLorca

摘要:

一个简单而通用的策略,命名为滑移线-修正晶格旋转分析(ST-MLRA),提出了使多晶合金的表面信息的活动滑移系统的识别。滑移面迹线取向被用来定义潜在的活动滑移面,而活动滑移面内的实际滑移方向是从晶粒旋转获得的,如由作为变形结果的极图中的晶粒取向的迹线的拉伸所指示的。该策略在HCP镁合金中的应用实例用于说明。他们表明,该策略是简单的实施,并允许识别每个晶粒中的主动滑移系统。

英文摘要:

A simple and versatile strategy, denominated Slip Trace - Modified Lattice Rotation Analysis (ST-MLRA), is presented to enable the identification of the active slip systems in polycrystalline alloys from surface information. The slip plane trace orientation is used to define the potential active slip planes while the actual slip direction within the active slip plane is obtained from the grain rotation, as indicated by the stretching of the trace of the grain orientation in the pole figure as a result of deformation. Examples of application of the strategy in a HCP Mg alloy are presented for illustration. They show that the strategy is simple to implement and allows to identify the active slip system(s) in each grain.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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