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arXiv 2202.02835cond-mat.mtrl-sci
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掺杂半导体中的电子–声子相互作用与纵–横声子劈裂

Electron-phonon interaction and longitudinal-transverse phonon splitting in doped semiconductors

Francesco Macheda, Paolo Barone, Francesco Mauri

AI总结:

本文发展基于最大局域化 Wannier 函数的方法,纳入自由载流子屏蔽,揭示掺杂削弱立方碳化硅 Fröhlich 耦合及纵–横声子劈裂并影响电子寿命。

摘要:

我们研究掺杂对掺杂半导体中电子–声子相互作用及声子频率的影响,并考虑有限温度下自由载流子存在时的屏蔽效应。借助开发的一种基于最大局域化 Wannier 函数的计算方法,我们研究了屏蔽对类 Fröhlich 顶点及动力学矩阵长程分量的影响,超越了现有针对未掺杂晶体的最先进描述。我们将该方法应用于立方碳化硅:在掺杂存在时,其 Fröhlich 耦合和纵–横声子劈裂均显著减弱,进而影响电子寿命等可观测性质。

英文摘要:

We study the effect of doping on the electron-phonon interaction and on the phonon frequencies in doped semiconductors, taking into account the screening in presence of free carriers at finite temperature. We study the impact of screening on the Fröhlich-like vertex and on the long-range components of the dynamical matrix, going beyond the state-of-the-art description for undoped crystals, thanks to the development of a computational method based on maximally localized Wannier functions. We apply our approach to cubic silicon carbide, where in presence of doping the Fröhlich coupling and the longitudinal-transverse phonon splitting are strongly reduced, thereby influencing observable properties such as the electronic lifetime.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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