Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artefacts. Here, Optical Near-field Electron Microscopy (ONEM) is proposed, an imaging technique that combines non-invasive probing with light, with a high spatial resolution read-out via electron optics. Close to the specimen, the optical near-fields are converted into a spatially varying electron flux using a planar photocathode. The electron flux is imaged using low energy electron microscopy, enabling label-free nanometric resolution without the need to scan a probe across the sample. The specimen is never exposed to damaging electrons.
Halide perovskites have remarkable properties for relatively crudely processed semiconductors, including large optical absorption coefficients and long charge carrier lifetimes. Thanks to such properties, these materials are now competing with established technologies for use in cost-effective and efficient light harvesting and light emitting devices. Nevertheless, our fundamental understanding of the behaviour of charge carriers in these materials particularly on the nano to micro scale has on the whole lagged behind the empirical device performances. Such understanding is essential to contro…
Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand the waveguide-coupled plasmonic antenna in as-fabricated heat-assisted magnetic recording heads. In order validate and predict results and to extract information from experimental measurements that is physically comparable to simulations, a model was developed to translate the simulated electric field into expected near-field measurements using physical para…
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue - overconfidence in measurement results with nanoscale statistical uncertainties that can be invalid due to microscale systematic errors. In this article, we report a comprehensive solution to this underappreciated problem. We develop arrays of subresolution apertures into the first reference materials that enable localization errors approaching the atomic scale across a submillimeter field. We present no…
We propose a chiral imaging modality based on optical chirality engineering, fluorescence-detected circular dichroism and structured illumination microscopy. In this method, the optical chirality of the illumination is structured and the circular dichroism dependent fluorescence is detected. With image reconstruction, the spatial distribution of chiral domains can be obtained at sub-diffraction limited resolution. We theoretically demonstrate this method and discuss the feasibility using an optical chirality engineering approach based on far-field optics.
We have implemented three different optical methods to quantitatively assess the thickness of thin GaSe flakes transferred on both transparent substrates, like Gel-Film, or SiO2/Si substrates. We show how their apparent color can be an efficient way to make a quick rough estimation of the thickness of the flakes. This method is more effective for SiO2/Si substrates as the thickness dependent color change is more pronounced on these substrates than on transparent substrates. On the other hand, for transparent substrates, the transmittance of the flakes in the blue region of the visible spectrum…
Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase matching to excite phonon polaritons, which manifest as nanoscale interference fringes in raster images. However, s-SNOM lacks the ability to detect the progression of near-field property along the perpendicular axis to the surface. Here, we perform near-field analysis of a micro-disk and a reflective edge made of isotopically pure hexagonal boron nitride (h-11BN)…
The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is affected by excitonic resonances, charge transfer effects, doping, sample stress and strain, and surface roughness. Knowledge of the dielectric function grants access to a material's transmissive and absorptive characteristics. Here we introduce the dual scanning near field optical microscope (dual s-SNOM) for imaging local dielectric variations and extract…
Confocal laser scanning microscopy (CLSM) is a non-destructive, highly-efficient optical characterization method for large-area analysis of graphene on different substrates, which can be applied in ambient air, does not require additional sample preparation, and is insusceptible to surface charging and surface contamination. CLSM leverages optical properties of graphene and provides greatly enhanced optical contrast and mapping of thickness down to a single layer. We demonstrate the effectiveness of CLSM by measuring mechanically exfoliated and chemical vapor deposition graphene on Si/SiO2, an…
In the paper, combined bimodal microscopic visualization of biological objects based on reflection-mode optical and photoacoustic measurements was presented. Gasmicrophone configuration was chosen for the registration of photothermal response. Precise positioning of the scanning laser beam with modulated intensity was performed employing acousto-optic deflectors. Photoacoustic images are shown to give complementary details to the optical images obtained in the reflected light. Specifically, the photoacoustic imaging mode allows much better visualization of the features with enhanced heat local…
We theorize the surface step characterization by reflected incoherent-light differential interference microscopy with consideration of the optical diffraction effect. With the integration of localization analysis, we develop a quantitative differential interference optical system, by which we demonstrate that the axial resolution of measuring surface height variation is sensitive to the shear distance between the two spatially differentiated beams. We fabricate three nanometer-size steps by photolithography, and successfully characterize their 1D height variations with 0.13 nm Hz^(-1/2) axial …
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of 150 nm that acts as a highly sensitive probe for external radiation pressure. An Allan deviation-based stability analysis of the setup yields an optimal 0.1 Hz measurement bandwidth over which the microscope is thermally limited. Over this bandwidth, and with a genuine sine-wave external drive, we demonstrate an optical force resolution down to 3 fN in water a…
Scan-less full-field fluorescence-lifetime dual-comb microscopy using two-dimensional spectral mapping and frequency multiplexing of dual-optical-comb beats
Local Chiral Optical Responses in Phthalocyanine Molecular Assemblies Revealed by Photoinduced Force Microscopy
Kwansei Gakuin University（关西学院大学）；Osaka Metropolitan University（大阪公立大学）；Ritsumeikan University（立命馆大学）；Osaka Research Institute of Industrial Science and Technology（大阪市立工业技术研究所）；Ritsumeikan Semiconductor Application research center (RISA)（立命馆半导体应用研究中心）
A theory is presented to describe the heat-flux radiated in near-field regime by a set of interacting nanoemitters held at different temperatures in vacuum or above a solid surface. We show that this thermal energy can be focused and even amplified in spots that are much smaller than those obtained with a single thermal source. We also demonstrate the possibility to locally pump heat using specific geometrical configurations. These many body effects pave the way to a multi-tip near-field scanning thermal microscopy which could find broad applications in the fields of nanoscale thermal manageme…
Optical methods for monitoring the electrochemical reaction at the interface are advantageous because of their table-top setup and ease of integration into reactors. Here we apply EDL-modulation microscopy to one of the main components of amperometric measurement devices: a microelectrode. We present experimental measurements of the EDL-modulation contrast from the tip of a tungsten microelectrode at various electrochemical potentials inside a ferrocene-dimethanol \ch{Fe(MeOH)2} solution. By the combination of the dark-field scattering microscope and the lock-in detection technique, we measure…
