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利用光学记忆效应通过散射表面进行三维扫描显微镜成像

3D scanning microscopy through scattering surfaces using the optical memory effect

Harish Sasikumar, Gerwin Osnabrugge, Kirsten Gerritsma, Bahareh Mastiani, Ivo M. Vellekoop

arXiv 2607.14751首次发表:更新:

AI 中文总结

研究利用光学记忆效应,通过适当移动和缩放校正波前扩展等晕区,实现透过散射层的三维扫描显微镜成像,横向和轴向扫描范围增加,无需额外测量,且结果与模型相符并能提取散射层位置。

AI 中文摘要

波前整形使光能够透过散射物体聚焦。然而,所发现的波前校正仅在称为等晕区的小区域有效。本文提出一种简单方法,通过适当移动和缩放校正后的波前扩展等晕区,经散射层横向扫描范围增加8.6倍,轴向范围增加1.5倍,无需额外波前整形测量。结果与几何模型相符,还能从测量中提取散射层有效位置。

英文摘要

Wavefront shaping allows light to be focused through scattering objects. However, the wavefront correction found is only valid in a small region called the isoplanatic patch. Here we present a simple approach to extend this isoplanatic patch by shifting and scaling the corrected wavefront appropriately, demonstrating an 8.6-fold increase in the lateral scanning range and a 1.5-fold increase in the axial range through a scattering layer without the need to perform additional wavefront shaping measurements. Our findings agree well with a simple geometrical model that also allows us to extract the effective position of the scattering layer from the measurements.

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