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arXiv 2012.04346physics.app-phcond-mat.mtrl-sci
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识别并理解缺陷对钙钛矿光电器件的积极作用

Identifying and understanding the positive impact of defects for perovskites optoelectronic devices

Yu-Hao Deng

AI总结:

本研究突破缺陷有害的传统认知,提出利用半导体缺陷俘获光生载流子提升光电导增益的方法,制备出创纪录性能的光电探测器,为高性能光电探测器设计提供新思路。

摘要:

缺陷通常被认为会对材料中的载流子复合、电荷输运和离子迁移产生负面影响,进而降低光电器件的效率、响应速度和稳定性。与此同时,大量致力于减少缺陷的研究已大幅提升了器件性能。那么,缺陷在光电器件中能否发挥积极作用?本文基于对半导体中缺陷相关效应的深入理解,利用缺陷对光生载流子的俘获作用来提升光电探测中的光电导增益。最终,该光电探测器实现了创纪录的光电导增益、增益-带宽积和探测极限。本研究突破了缺陷有害的普遍认知,提出缺陷在光电探测中可发挥积极作用的新观点,或可为高性能光电探测器的设计提供指导。

英文摘要:

Defects are generally regarded to have negative impacts on carrier recombination, charge-transport and ion migration in materials, which thus lower the efficiency, speed and stability of optoelectronic devices. Meanwhile, lots of efforts which focused on minimizing defects have greatly improved the performances of devices. Then, can defects be positive in optoelectronic devices? Herein, relying on in-depth understanding of defect-associated effects in semiconductors, trapping of photo-generated carriers by defects is applied to enlarge photoconductive gain in photodetection. Therefore, the record photoconductive gain, gain-bandwidth product and detection limit were achieved in this photodetector. Exceeding the general concept that defects are harmful, we identify a new view that the defects can be positive in photodetection, which may guide us to design high-performance photodetectors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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