arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2009.06285cond-mat.mtrl-sci
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n型(In,Fe)As中的少子自旋杂质带:铁磁半导体的材料前景

Minority-Spin Impurity Band in n-Type (In,Fe)As: A Materials Perspective for Ferromagnetic Semiconductors

Masaki Kobayashi, Le Duc Anh, Jan Minar, Walayat Khan, Stephan Borek, Pham Nam Hai, Yoshihisa Harada, Thorsten Schmitt, Masaharu Oshima, Atsushi Fujimori, Masaa… 展开作者

Masaki Kobayashi, Le Duc Anh, Jan Minar, Walayat Khan, Stephan Borek, Pham Nam Hai, Yoshihisa Harada, Thorsten Schmitt, Masaharu Oshima, Atsushi Fujimori, Masaaki Tanaka, Vladimir N. Strocov

摘要:

充分理解n型铁磁半导体(FMS)的特性,作为主流p型铁磁半导体的补充,是半导体自旋电子学中一个具有挑战性的目标,因为n型FMS中的铁磁性在理论上是不平凡的。软X射线角分辨光电子能谱(SX-ARPES)是研究FMS中载流子诱导铁磁性机制的有效手段。本文利用SX-ARPES方法对典型的n型FMS(In,Fe)As进行了研究,揭示了包括Fe-3d杂质带和InAs主带在内的完整能带结构,为电子占据InAs导带提供了直接证据。少数自旋Fe-3d IB被发现位于导带最小值(CBM)之下。IB是由未占据的Fe-3d态与InAs的占据的CBM以自旋相关的方式杂化形成的,导致CB的大的自旋极化。带隙的能带结构随带隙填充的变化而变化,这不能用刚性能带图来解释,这为FMS材料中载流子诱导铁磁性的实现提供了一个统一的图像。

英文摘要:

Fully understanding the properties of n-type ferromagnetic semiconductors (FMSs), complementary to the mainstream p-type ones, is a challenging goal in semiconductor spintronics because ferromagnetism in n-type FMSs is theoretically non-trivial. Soft-x-ray angle-resolved photoemission spectroscopy (SX-ARPES) is a powerful approach to examine the mechanism of carrier-induced ferromagnetism in FMSs. Here our SX-ARPES study on the prototypical n-type FMS (In,Fe)As reveals the entire band structure including the Fe-3d impurity bands (IBs) and the host InAs ones, and provides direct evidence for electron occupation of the InAs-derived conduction band (CB). A minority-spin Fe-3d IB is found to be located just below the conduction-band minimum (CBM). The IB is formed by the hybridization of the unoccupied Fe-3d states with the occupied CBM of InAs in a spin-dependent way, resulting in the large spin polarization of CB. The band structure with the IB is varied with band filling, which cannot be explained by the rigid-band picture, suggesting a unified picture for realization of carrier-induced ferromagnetism in FMS materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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