arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2009.02520cs.ITmath.IT
收藏

估计缺陷数的最优确定性分组测试算法

Optimal Deterministic Group Testing Algorithms to Estimate the Number of Defectives

Nader H. Bshouty, Catherine A. Haddad-Zaknoon

摘要:

我们研究的问题,估计有缺陷的项目$d$内的一堆$n$元素的$Δ>1$的乘法因子,使用确定性组测试算法。我们带来的自适应和非自适应确定性设置中所需的测试数量的上限和下限给出了一个上限$D$上的缺陷数量。对于自适应确定性设置,我们的结果表明,任何算法估计的缺陷数量的$Δ$的乘法因子必须至少进行$Ω\left((D/Δ^2)\log (n/D) \right )$测试。这扩展了在\cite{ALA17}中实现的非自适应算法的相同下限。此外,我们给出了一个多项式时间的自适应算法,表明我们的界是紧到一个小的加法项。对于非自适应算法,通过非构造性证明得到了$O((D/Δ^2)$ $(\log (n/D)+\log Δ) )$的上界。这改进了来自\cite{ALA17}的下限$O((\log D)/(\logΔ))D\log n)$,并将下限匹配到小的加法项。此外,我们还研究了多项式时间的构造性算法。我们利用已有的多项式时间可构造的\emph{expander regular bipartite graphs}、\emph{extractors}和\emph{condensers}构造了两个多项式时间算法。第一个算法进行$O((D^{1+o(1)}/Δ^2)\cdot \log n)$测试,第二个算法进行$(D/Δ^2)\cdot quazipoly$ $(\log n)$测试。这是第一个具有几乎最佳测试复杂度的显式构造。

英文摘要:

We study the problem of estimating the number of defective items $d$ within a pile of $n$ elements up to a multiplicative factor of $Δ>1$, using deterministic group testing algorithms. We bring lower and upper bounds on the number of tests required in both the adaptive and the non-adaptive deterministic settings given an upper bound $D$ on the defectives number. For the adaptive deterministic settings, our results show that, any algorithm for estimating the defectives number up to a multiplicative factor of $Δ$ must make at least $Ω\left((D/Δ^2)\log (n/D) \right )$ tests. This extends the same lower bound achieved in \cite{ALA17} for non-adaptive algorithms. Moreover, we give a polynomial time adaptive algorithm that shows that our bound is tight up to a small additive term. For non-adaptive algorithms, an upper bound of $O((D/Δ^2)$ $(\log (n/D)+\log Δ) )$ is achieved by means of non-constructive proof. This improves the lower bound $O((\log D)/(\logΔ))D\log n)$ from \cite{ALA17} and matches the lower bound up to a small additive term. In addition, we study polynomial time constructive algorithms. We use existing polynomial time constructible \emph{expander regular bipartite graphs}, \emph{extractors} and \emph{condensers} to construct two polynomial time algorithms. The first algorithm makes $O((D^{1+o(1)}/Δ^2)\cdot \log n)$ tests, and the second makes $(D/Δ^2)\cdot quazipoly$ $(\log n)$ tests. This is the first explicit construction with an almost optimal test complexity.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑