暗场X射线显微术中衬度模型的几何光学形式
Geometrical Optics Formalism to Model Contrast in Dark-Field X-ray Microscopy
摘要：
暗场X射线显微术是一种新的全场成像技术，它可以无损地三维绘制深埋晶体元素内部的结构和局部应变。将物镜放置在衍射光束中产生局部体积的放大投影图像。我们提供了一个一般的形式主义的基础上几何光学的衍射成像，适用于任何晶体空间群。这允许基于微机械模型来模拟衍射图像。我们目前的例子模拟的形式主义，演示它如何可以用来设计新的实验或解释现有的。特别是，我们展示了如何修改实验设计可以定制的倒数空间分辨率函数映射变形梯度张量的特定组件。形式主义支持多长度尺度实验，因为它使DFXM能够与3DXRD接口。通过与直位错周围应变场的实验图像的比较，证明了该形式主义。
英文摘要：
Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any crystallographic space group. This allows simulation of diffraction images based on micro-mechanical models. We present example simulations with the formalism, demonstrating how it may be used to design new experiments or interpret existing ones. In particular, we show how modifications to the experimental design may tailor the reciprocal-space resolution function to map specific components of the deformation gradient tensor. The formalism supports multi-length scale experiments, as it enables DFXM to be interfaced with 3DXRD. The formalism is demonstrated by comparison to experimental images of the strain field around a straight dislocation.
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