arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1804.04400physics.ins-detcond-mat.mes-hallcond-mat.mtrl-sci
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基于几何约束纳米畴壁的磁力显微成像

Magnetic Force Microscopy Imaging Using Geometrically Constrained Nano-Domain Walls

Héctor Corte-León, Luis Alfredo Rodríguez, Matteo Pancaldi, David Cox, Etienne Snoeck, Vladimir Antonov, Paolo Vavassori, Olga Kazakova

摘要:

通过使用聚焦离子束光刻修改标准商业磁力显微镜(MFM)探针来定制域壁探针(DW探针)。研磨掉来自探针的过量磁性涂层,在探针顶点的一面上留下V形纳米结构。由于纳米结构的形状各向异性,这种探针具有四种可能的磁状态,这取决于沿着V形的每个臂的磁化方向。相反极性的两个状态的特征在于存在的几何约束DW,钉扎在角落的V形纳米结构。在其他两种状态下,磁化曲线的角落与相反的手征。电子全息研究,数值模拟的支持下,表明一个强大的杂散场从钉扎DW发出,而一个弱得多的杂散场产生的卷曲配置。使用原位MFM,我们表明,DW探头的磁化状态可以很容易地通过施加外部磁场控制,从而证明这种类型的探头可以用作具有低或高杂散磁场强度的可切换工具。我们证明,DW-探头能够采集磁图像与样品磁化的干扰可以忽略不计,类似于商业低矩探头,但具有更高的磁对比度。此外,卷曲状态下的DW探针提供了关于样品磁化的平面内分量的补充信息,这是标准方法无法实现的,并且提供了关于杂散场的附加信息,例如,当对DW成像时。

英文摘要:

Domain wall probes (DW-probes) were custom-made by modifying standard commercial magnetic force microscopy (MFM) probes using focused ion beam lithography. Excess of magnetic coating from the probes was milled out, leaving a V-shaped nanostructure on one face of the probe apex. Owing to the nanostructure's shape anisotropy, such probe has four possible magnetic states depending on the direction of the magnetization along each arm of the V-shape. Two states of opposite polarity are characterised by the presence of a geometrically constrained DW, pinned at the corner of the V-shape nanostructure. In the other two states, the magnetization curls around the corner with opposite chirality. Electron holography studies, supported by numerical simulations, demonstrate that a strong stray field emanates from the pinned DW, whilst a much weaker stray field is generated by the curling configurations. Using in situ MFM, we show that the magnetization states of the DW-probe can be easily controlled by applying an external magnetic field, thereby demonstrating that this type of probe can be used as a switchable tool with a low or high stray field intensity. We demonstrate that DW-probes enable acquiring magnetic images with a negligible interference with the sample magnetization, similar to that of commercial low moment probes, but with a higher magnetic contrast. In addition, the DW-probe in the curl state provides complementary information about the in-plane component of the sample's magnetization, which is not achievable by standard methods and provides additional information about the stray fields, e.g. as when imaging DWs.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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