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arXiv 2005.13121cs.ARcs.CR
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再谈RowHammer:现代DRAM器械和缓解技术的实验分析

Revisiting RowHammer: An Experimental Analysis of Modern DRAM Devices and Mitigation Techniques

Jeremie S. Kim, Minesh Patel, A. Giray Yaglikci, Hasan Hassan, Roknoddin Azizi, Lois Orosa, Onur Mutlu

摘要:

为了阐明RowHammer如何在电路级影响现代和未来的设备,我们首先在1580 DRAM芯片上对RowHammer进行了实验表征(408个DDR3、652个DDR4和520个LPDDR4),来自300个DRAM模块(60 x DDR3、110 x DDR4和130 x LPDDR4),禁用RowHammer保护机制,跨越三大DRAM制造商的多个不同技术节点。我们的研究明确表明,较新的DRAM芯片更容易受到RowHammer的影响:随着设备特征尺寸的减小,引发RowHammer位翻转所需的激活次数也减少了,在我们测试的最脆弱的芯片中,激活次数减少到9.6k(每行4.8k到两行)。我们评估了五个国家的最先进的RowHammer缓解机制,使用周期准确的模拟的背景下,从我们的芯片采取的真实数据,研究如何缓解机制的规模与芯片的脆弱性。我们发现,现有的机制要么是不可扩展的,或遭受过大的性能开销,在预计未来的设备,我们观察到的趋势RowHammer漏洞。因此,研究更有效的RowHammer解决方案至关重要。

英文摘要:

In order to shed more light on how RowHammer affects modern and future devices at the circuit-level, we first present an experimental characterization of RowHammer on 1580 DRAM chips (408x DDR3, 652x DDR4, and 520x LPDDR4) from 300 DRAM modules (60x DDR3, 110x DDR4, and 130x LPDDR4) with RowHammer protection mechanisms disabled, spanning multiple different technology nodes from across each of the three major DRAM manufacturers. Our studies definitively show that newer DRAM chips are more vulnerable to RowHammer: as device feature size reduces, the number of activations needed to induce a RowHammer bit flip also reduces, to as few as 9.6k (4.8k to two rows each) in the most vulnerable chip we tested. We evaluate five state-of-the-art RowHammer mitigation mechanisms using cycle-accurate simulation in the context of real data taken from our chips to study how the mitigation mechanisms scale with chip vulnerability. We find that existing mechanisms either are not scalable or suffer from prohibitively large performance overheads in projected future devices given our observed trends of RowHammer vulnerability. Thus, it is critical to research more effective solutions to RowHammer.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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