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arXiv 1907.08359cond-mat.mtrl-sci
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一类新型层状拓扑绝缘体的第一性原理预测

First-principles prediction of a new family of layered topological insulators

Ping Li, Jiangying Yu, Jinrong Xu, Li Zhang, Kai Huang

摘要:

研究了几十种层状V $_2$ IV $_2$ VI $_6$(V=P,As,Sb,Bi,IV=Si,Ge,Sn,Pb,VI=S,Se,Te)材料,其中几种已在实验中成功合成。其中,我们预测了9个强拓扑绝缘体(TI),2个强拓扑金属(TM)和近20个平凡绝缘体的平衡结构。的TI是在(1;111)拓扑类,具有从0.04到0.2 eV的范围内的能隙。强TM和平凡绝缘体分别属于(1;111)和(0;000)拓扑类。小的压缩应变很容易将一些不重要的绝缘体变成强的TI。该研究不仅丰富了拓扑材料家族,也丰富了范德华层状材料家族,为未来的自旋电子器件提供了有希望的候选材料。

英文摘要:

Dozens of layered V$_2$IV$_2$VI$_6$ (V=P, As, Sb, Bi, IV=Si, Ge, Sn, Pb, VI=S, Se, Te) materials are investigated, several of which have been successfully synthesized in experiment. Among them, we predict nine strong topological insulators (TIs), two strong topological metals (TMs) and nearly twenty trivial insulators at their equilibrium structures. The TIs are in the (1;111) topological class, with energy gaps ranging from 0.04 to 0.2 eV. The strong TMs and the trivial insulators belong to the (1;111) and (0;000) topological classes, respectively. Small compressive strains easily turn some of the trivial insulators into strong TIs. This study enriches not only the family of topological materials but also the family of van der Waals layered materials, providing promising candidates for the future spintronic devices.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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