arXiv 1802.061022018-02-16physics.app-phcond-mat.mtrl-sci

利用G模式Kelvin探针力显微镜对瞬态表面光电压动力学快速演化的研究

Mapping fast evolution of transient surface photovoltage dynamics using G-Mode Kelvin probe force microscopy

Liam Collins, Mahshid Ahmadi, Jiajun Qin, Olga S. Ovchinnikova, Bin Hu, Stephen Jesse, Sergei V. Kalinin

摘要：

材料中的光电现象，例如有机/无机混合钙钛矿，取决于光诱导载流子产生与快速（电子）和较慢（离子）过程之间的复杂相互作用，所有这些都被认为受到结构不均匀性的强烈影响，例如界面和晶界。在这里，我们开发了一个时间分辨开尔文探针力显微镜（KPFM）的方法，基于G模式SPM平台，允许量化的表面光电压（SPV）与微秒的时间和纳米级的空间分辨率。我们证明了甲基溴化铅铵（MAPbBr 3）薄膜的方法，并进一步强调了无监督聚类方法的有用性，以快速识别信息丰富的SPV数据集的空间变异。使用这种技术，我们观察到并发的空间和超快的时间变化的SPV产生的整个薄膜，表明结构可能是负责的异质性行为。

英文摘要：

Optoelectronic phenomena in materials such as organic/inorganic hybrid perovskites depend on a complex interplay between light induced carrier generation and fast (electronic) and slower (ionic) processes, all of which are known to be strongly affected by structural inhomogeneities such as interfaces and grain boundaries. Here, we develop a time resolved Kelvin probe force microscopy (KPFM) approach, based on the G-Mode SPM platform, allowing quantification of surface photovoltage (SPV) with microsecond temporal and nanoscale spatial resolution. We demonstrate the approach on methylammonium lead bromide (MAPbBr3) thin films and further highlight the usefulness of unsupervised clustering methods to quickly discern spatial variability in the information rich SPV dataset. Using this technique, we observe concurrent spatial and ultra-fast temporal variations in the SPV generated across the thin film, indicating that structure is likely responsible for the heterogenous behavior.

机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。

摘要：

英文摘要：

相关论文