通过开尔文探针力显微镜对独立超薄玻璃材料的接触电化进行空间和时间解析映射
Spatially and Temporally Resolved Mapping of Contact Electrification on Stand-Alone Ultrathin Glass Materials via Kelvin Probe Force Microscopy
AI总结：
本研究利用开尔文探针力显微镜解析超薄玻璃材料的接触电化现象，揭示其表面电荷行为及放电特性，并提出自电容模型估算电荷密度。
摘要：
接触电化（CE）仍然是先进材料技术中的关键挑战，其中不受控的表面充电可能影响制造性、可靠性和性能。超薄玻璃是一种微米级厚度的先进氧化物材料，用于下一代电子设备的柔性触控屏。在这里，我们利用边带模式开尔文探针力显微镜（KPFM）可视化和量化超薄玻璃上的接触电化诱导表面电荷。使用纳米级原子力显微镜（AFM）探针在超纯氮气条件下扫描并诱导摩擦电荷于独立玻璃表面。时间依赖性测量显示，30微米厚的玻璃样品表面电荷在240分钟内从4.47伏降至0.37伏。此外，静电电荷通过材料本体表现出类似电容器的放电行为，产生约41分钟的长放电时间常数。这种行为不同于之前报道的热生长SiO2薄膜中观察到的横向表面放电行为。开发了一个自电容分析模型来估计相应的表面电荷密度（σ），得到在30微米处为136.26±16.25微库/平方米，在100微米处为131.44±28.41微库/平方米的可比值。此外，施加到AFM探针的外部偏压可用于增强、抑制或反转玻璃材料的固有CE响应。
英文摘要：
Contact electrification (CE) remains a critical challenge in advanced material technologies where uncontrolled surface charging can compromise manufacturability, reliability, and performance in practical applications. Ultrathin glass with micrometer-scale thickness is a state-of-the-art specialty oxide material for flexible touchscreens in next-generation electronic devices. Here, we visualize and quantify CE-induced surface charges on ultrathin glass using sideband-mode Kelvin probe force microscopy (KPFM). Nanoscale atomic force microscopy (AFM) probes are used to scan and induce triboelectric charges on stand-alone glass surfaces under ultra-pure N$_2$ conditions. Time-dependent measurements reveal that surface charges on a 30~$μ$m-thick glass sample decay from 4.47~V to 0.37~V over 240~minutes. Furthermore, electrostatic charges are found to exhibit capacitor-like discharging behavior primarily through the bulk material, yielding a long relaxation time constant of approximately 41~minutes. This behavior differs from the lateral surface discharging observed in thermally grown SiO$2$ thin films reported previously. A self-capacitance analytical model is developed to estimate the corresponding surface charge density ($σ$), yielding comparable values of 136.26~$\pm$~16.25~$μ$C/m$^2$ at 30~$μ$m and 131.44~$\pm$~28.41~$μ$C/m$^2$ at 100~$μ$m. Additionally, external bias applied to AFM tips can be used to enhance, suppress, or invert the intrinsic CE response of glass materials.
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