组合与高通量合成及加工中的材料发现：扫描探针显微镜的新前沿
Materials Discovery in Combinatorial and High-throughput Synthesis and Processing: A New Frontier for SPM
AI总结：
本文综述了扫描探针显微镜在组合与高通量材料合成中的新应用，重点介绍压电响应力显微镜、电化学应变显微镜等定量方法，论证其将在材料预测-合成-表征闭环中发挥关键作用。
摘要：
三十多年来，扫描探针显微镜（SPM）一直是探索材料纳米尺度乃至原子尺度结构与功能的关键方法，可在环境、液体和真空条件下工作。从历史上看，SPM 的应用主要处于下游环节，图像和光谱主要作为材料微观结构和性质的定性数据来源，仅在少数情况下提供基础物理知识。然而，通过自驱动实验室加速材料合成的快速发展，以及组合铺展库等成熟应用，正有望改变这一范式。快速合成要求具备在小尺度上高通量探测材料结构与功能的匹配能力。SPM 天然满足这些标准，单次测量即可提供丰富多样的数据。本文概述了适用于这些新兴应用的 SPM 方法，并强调其定量化能力，重点介绍压电响应力显微镜、电化学应变显微镜、导电测量和表面光电压测量。我们讨论了未来的挑战与机遇，并断言 SPM 将在从材料预测、合成到表征的闭环中发挥关键作用。
英文摘要：
For over three decades, scanning probe microscopy (SPM) has been a key method for exploring material structures and functionalities at nanometer and often atomic scales in ambient, liquid, and vacuum environments. Historically, SPM applications have predominantly been downstream, with images and spectra serving as a qualitative source of data on the microstructure and properties of materials, and in rare cases of fundamental physical knowledge. However, the fast-growing developments in accelerated material synthesis via self-driving labs and established applications such as combinatorial spread libraries are poised to change this paradigm. Rapid synthesis demands matching capabilities to probe structure and functionalities of materials on small scales and with high throughput. SPM inherently meets these criteria, offering a rich and diverse array of data from a single measurement. Here, we overview SPM methods applicable to these emerging applications and emphasize their quantitativeness, focusing on piezoresponse force microscopy, electrochemical strain microscopy, conductive, and surface photovoltage measurements. We discuss the challenges and opportunities ahead, asserting that SPM will play a crucial role in closing the loop from material prediction and synthesis to characterization.
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